APM-40B
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Product Description
ACCESSROIES ORDER no. |
ITEM | SPECIFICATION | APM-40BRF | APM-40BR | APM-40BT |
X40-HB30
X40-HTBI |
Viewing head |
30° inclined gemel binocular head, 360° rotatable, interpupillary adjustable distance: 54-76mm, diopter ±5 adjustable 30° inclined gemel trinocular head, 360° rotatable, interpupillary adjustable distance: 54-75mm, diopter ±5 adjustable, splitting ratio R:T=0:100 or 50:50 Ergonomic gemel binocular viewing head, 30°- 60° inclination |
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X40-10X22 X40-10X22TR X40-10X22TC X40-10X22TG X40-10X22D X40-10X22TRD X40-15X16 |
High eye-point wide-field plan eyepiece |
PL10X/22mm PL10X/22mm with micrometer PL10X/22mm with with crisscross PL15X/16mm |
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APM40-5XL APM40-10XL APM40-20XL APM40-50XL |
Long Work Distance Strain-Free Plan Achromatic Objective |
5X/0.15, W.D.=10.8 mm 10X/0.3, W.D.=12.20 mm 20X/0.45, W.D.=4.00 mm 50X/0.55, W.D.=7.90 mm |
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APM40-4X APM40-10X APM40-20X APM40-40X APM40-60X |
Strain-Free Plan Achromatic Objective |
4X/0.1, W.D.=15.0 mm, Cover glass= 0.17mm 10X/0.25, W.D.=10.8 mm, Cover glass=0.17mm 20X/0.40, W.D.=1.50 mm, Cover glass=0.17mm 40X/0.65, W.D.=0.80 mm, Cover glass=0.17mm 60X/0.85, W.D.=0.30 mm, Cover glass=0.17mm |
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X40-NQ4 X40-NQ5 |
Nosepiece |
Inwardly inclined, backward quadruple nosepiece Inwardly inclined, backward quintuple nosepiece |
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APM40-RTQ APM40-TQ APM40-RQ |
Polarizer set |
Transflective polarizing mirror set: Analyzer set, 360° rotation, 2° value, 6' accuracy, with locking mechanism, polarizer set, 360° rotation, 0, 90, 180, 270 four-speed scale Transmission polarizing mirror set: Analyzer set, 360° rotation, 2”, precision 6’, with locking mechanism, polarizer set, 360° rotation, 0, 90, 180, 270 four-speed scale Reflective polarizing mirror set: polarizing mirror set, 360° rotation, 2° grid value, 6' accuracy, with locking mechanism, polarizing insert plate |
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APM40-PBOS |
Analyzer set |
Intermediate lens group, equipped with push-pull analyzer group, can be moved out of the optical path; built-in Bertrand lens, turntable switching mechanism (center and focal length adjustable) |
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APM40-λFR APM40-λFGW APM40-λFET |
Test plate compensator |
λFirst-order red plate (OPD 551nm) Guarter-wave plate (1/4λ test plate) (OPD 147.3nm) Quartz wedge ( I-VI level) |
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Focusing |
Low-position coaxial coarse and fine adjustment, Coarse range: 30mm, fine precision: 0.002mm, coaxial focus system with upper limited and tension adjustment, work stage height adjustable |
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APM40-PRS |
Stage |
Rotating metal working platform, graphite spraying on the surface, anti-corrosion and wear-resistant; diameter 160mm, 360°rotatable, 1° scale, 6' accuracy, with locking device |
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APM40-CD0.9 |
Condenser |
Strain-free swing condenser N A.0.9 |
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APM40-RPLH
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Illumination |
Main supply 100V-240V AC50/60Hz, 12V/50W halogen lamp house for reflected light, center pre-set, intensity adjustable Main supply 100V-240V AC50/60Hz, 12V/50W halogen lamp house for transmitted light, center pre-set, intensity adjustable Reflected Illumination (including LBD filter set), with field diaphragm and diaphragm aperture Halogen lamp 12V/50W |
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X40-FY X40-FG X40-FCC X40-FN |
Filter |
Yellow filter (Φ 45) Green contrast filter (Φ 45) Color temperature conversion filter (Φ 45) (only for Holagen lamp) Neutral filter (Φ 45) |
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X40-035CT X40-05CT X40-065CT X40-1CT |
Camera adapter |
0.35X camera adapter, C-type interface, adjustable 0.5X camera adapter, C-type interface, adjustable 0.65X camera adapter, C-type interface, adjustable 1X camera adapter, C-type interface, adjustable |
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APM40-SH APM40-MCP X40-MR1 |
Other options Accessories |
Special XY movable ruler, movable range: 30mm*40mm Empty test plate (2 pcs) High-precision micrometer, grid value 0.01mm |
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Note: ''●'' Standard outfit ''໐'' optional outfit